首页>
外国专利>
Device for the measurement of deformations of a profile subject to one or more forces
Device for the measurement of deformations of a profile subject to one or more forces
展开▼
机译:用于测量型材在一个或多个力作用下的变形的装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
The device (3) has two Bragg grating optical fiber sensors extending parallel to a longitudinal axis of a section i.e. contact line (1), and placed between two V-shaped supports (5a, 5b) hooked at two points of the section. The sensors are arranged at distinct distances from a neutral axis plane of the section. Arms (4a, 4b) extend from the section and are connected to each other by a central armature (6). An independent claim is also included for a method for processing measurement of mechanical deformation of a section subjected to force.
展开▼