首页> 外国专利> ELECTRONIC MICROSCOPE, ELECTRONIC-MICROSCOPE IMAGE RECONSTRUCTION SYSTEM, AND ELECTRONIC-MICROSCOPE IMAGE RECONSTRUCTION METHOD

ELECTRONIC MICROSCOPE, ELECTRONIC-MICROSCOPE IMAGE RECONSTRUCTION SYSTEM, AND ELECTRONIC-MICROSCOPE IMAGE RECONSTRUCTION METHOD

机译:电子显微镜,电子显微图像重建系统和电子显微图像重建方法

摘要

An electronic microscope of the present invention is characterized in that a plurality of inclination images are obtained in which a sample (1) is inclined and imaged at different sample inclination axes, positional offset correction is performed at each rotation angle increment, a rotated observation subject is inclined and imaged at different angle steps, two reconstruction images are created from a group of the inclination images and the positional offset of the two reconstruction images is corrected, and a single reconstruction image is created by superimposing the two reconstruction images. An image reconstruction system can therefore be provided that is capable of reducing the burden on the user and implementing a multi-axial reconstruction technique in which strong contrast artefacts or sample contamination produced by the use of labels and limitations on applicable samples are eliminated.
机译:本发明的电子显微镜的特征在于,获得多个倾斜图像,其中,样品(1)在不同的样品倾斜轴上倾斜并成像,以每个旋转角度增量执行位置偏移校正,从而使被观察者旋转倾斜并以不同的角度步长成像,从一组倾斜图像创建两个重建图像,并校正两个重建图像的位置偏移,并通过将两个重建图像叠加来创建单个重建图像。因此,可以提供一种图像重建系统,该图像重建系统能够减轻用户的负担并实现多轴重建技术,该技术消除了由于使用标签而产生的强烈的对比度伪影或样品污染以及对适用样品的限制。

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