OLED OFFSET INSPECTOR AND INSPECTION METHOD USING THE SAME CAPABLE OF ACCURATELY INSPECTING THE POSITION OF A DOT PATTERN OR A STRIPE PATTERN ON THE ORGANIC FILM OF OLED

摘要

PURPOSE: An OLED offset inspector and an inspection method using the same are provided to enhance inspection reliability on multi-layer and the position of an organic film by accurately reading a boundary line even if the organic films are overlapped or twisted.;CONSTITUTION: An OLED offset inspector comprises an optical inspection unit(300). The optical inspection unit is installed on a horizontal guide(400). The optical inspection unit comprises a unit base(310), a CCD camera, a band pass filter, and a UV light source. The unit base is installed movably along the horizontal guide. The CCD camera is fixed on the unit base and is arranged perpendicularly to the OLED on a body(100). The band pass filter is arranged on the leading end of the lens of the CCD camera to filter light. The UV light source is arranged on the unit base to be able to irradiate UV light at a given angle to the OLED.;COPYRIGHT KIPO 2012