首页>
外国专利>
DEFORMATION MEASUREMENT METHOD USING A SHEARPGRAPHY AND A DEVICE USING THE SAME, CAPABLE OF ENHANCING THE UTILIZATION EFFICIENCY OF A NONDESTRUCTIVE INSPECTION BY IMPROVING THE PRECISION OF A QUANTITATIVE OUT-OF-PLANE DEFORMATION MEASUREMENT
DEFORMATION MEASUREMENT METHOD USING A SHEARPGRAPHY AND A DEVICE USING THE SAME, CAPABLE OF ENHANCING THE UTILIZATION EFFICIENCY OF A NONDESTRUCTIVE INSPECTION BY IMPROVING THE PRECISION OF A QUANTITATIVE OUT-OF-PLANE DEFORMATION MEASUREMENT
PURPOSE: A deformation measurement method using Shearography and a device using the same is provided to measure whole deformation of an object by measuring a base deformation created in the object.;CONSTITUTION: A deformation measurement method using Shearography is as follows. By changing shear amount due to using a shearing interferometer(130), several topological maps of an object(10)'s defective part according to each shearing amount is obtained. The deformation diagram of the defective part is calculated. The linear gradient between shearing change and shearing variation is calculated by a deformation diagram of the defective part according to shearing amount so that a maximum deformation diagram according to shearing amount is calculated. The deformation amount which shearing amount becomes zero is estimated by the maximum deformation diagram.;COPYRIGHT KIPO 2012
展开▼