首页> 外国专利> DEVICE FOR MEASURING CONCENTRICITY AND PARALLELIZATION-DEGREE WHICH CAN MEASURE THE CONCENTRIC PROPERTY AND PARALLELISM OF FIRST AND SECOND OBJECTS

DEVICE FOR MEASURING CONCENTRICITY AND PARALLELIZATION-DEGREE WHICH CAN MEASURE THE CONCENTRIC PROPERTY AND PARALLELISM OF FIRST AND SECOND OBJECTS

机译:可以测量第一对象和第二对象的集中度和并行度的集中度和并行度的测量设备

摘要

PURPOSE: A device for measuring concentricity and parallelization-degree is provided to measure the concentric property and parallelism of first and second objects.;CONSTITUTION: A device for measuring concentricity and parallelization-degree comprises a reflecting body, a reflection supporting part(20) and a main body(10). The reflecting body locates in the second object. The reflecting body reflects a part of the incident light in the first reflector. The reflecting body reflects a rest part of the incident light in the second reflecting surface. The reflection supporting part forms the cone supporting the reflecting body and faces the second object. The main body locates in the first object.;COPYRIGHT KIPO 2012
机译:目的:提供一种测量同心度和平行度的装置,用于测量第一,第二物体的同心度和平行度。组成:一种测量同心度和平行度的装置,包括一个反射体,一个反射支撑件(20)主体(10)。反射体位于第二物体中。反射体在第一反射器中反射一部分入射光。反射体在第二反射面反射入射光的其余部分。反射支撑部分形成支撑反射体的锥体并且面对第二物体。主体位于第一个对象中。; COPYRIGHT KIPO 2012

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