首页> 外国专利> ELECTRONIC DEVICE WHICH DETECTS AN ARC DEFECT GENERATION LOAD AMONG A PLURALITY OF LOADS, AN ELECTRONIC DEVICE SYSTEM, AND AN ARC DEFECT DETECTION METHOD THEREOF

ELECTRONIC DEVICE WHICH DETECTS AN ARC DEFECT GENERATION LOAD AMONG A PLURALITY OF LOADS, AN ELECTRONIC DEVICE SYSTEM, AND AN ARC DEFECT DETECTION METHOD THEREOF

机译:检测多种负载中的电弧缺陷产生负载的电子设备,电子设备系统及其电弧检测方法

摘要

PURPOSE: An electronic device, an electronic device system, and an arc defect detection method thereof are provided to appropriately handle an arc defect by accurately detecting a position in which arc defect is generated.;CONSTITUTION: An arc defect detection apparatus(220) outputs arc signal detection information when an arc signal is received from a wire harness connected to a plurality of loads. A controller(280) detects an arc defect generation load while successively supplying AC power to each load when the arc signal detection information is received from the arc defect detection apparatus.;COPYRIGHT KIPO 2012
机译:目的:提供一种电子设备,一种电子设备系统及其电弧缺陷检测方法,以通过准确地检测产生电弧缺陷的位置来适当地处理电弧缺陷。构成:电弧缺陷检测设备(220)输出当从连接到多个负载的线束接收到电弧信号时的电弧信号检测信息。当从电弧缺陷检测设备接收到电弧信号检测信息时,控制器(280)检测电弧缺陷产生负载,同时连续地向每个负载供应AC电力。COPYRIGHTKIPO 2012

著录项

  • 公开/公告号KR20120032925A

    专利类型

  • 公开/公告日2012-04-06

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20100094492

  • 发明设计人 KIM MYUNG CHUL;NOH KI HONG;JO SE JIN;

    申请日2010-09-29

  • 分类号G01R31/12;G01R31/02;

  • 国家 KR

  • 入库时间 2022-08-21 17:10:19

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