TEST PIN FOR THE HIGH DEGREE OF INTEGRATION AND A SOCKET FOR INSPECTING SEMICONDUCTORS CAPABLE OF SECURING THE SUFFICIENT MOVING DISTANCE OF PROBES REGARDLESS OF SMALL SIZES

摘要

PURPOSE: A test pin for the high degree of integration and a socket for inspecting semiconductors are provided to minimize the loss and the distortion of electric signals which are transferred to electric parts.;CONSTITUTION: A socket body(201) includes a plurality of holes and receives a pair of upper probes in one hole. A distance between holes is constant, and distances between the upper probes in the holes are constant. A spacer part(202) is arranged between the socket body and a lower cover(203) and includes a plurality of holes. Two integrated plate spring test pins are arranged in one hole. A distance between the holes is constant, and distances between the space parts of the integrated plate spring test pins are constant. The lower cover includes a plurality of holes. A pair of lower probes is arranged in one hole. A distance between the holes is constant, and distances between the lower probes are constant.;COPYRIGHT KIPO 2012