首页> 外国专利> RESIST COMPOSITION, A METHOD FOR FORMING RESIST PATTERNS, AND NOBLE COMPOUNDS CAPABLE OF IMPROVING LITHOGRAPHY CHARACTERISTIC BY INCLUDING NITROGEN-CONTAINING ORGANIC COMPOUND COMPONENTS

RESIST COMPOSITION, A METHOD FOR FORMING RESIST PATTERNS, AND NOBLE COMPOUNDS CAPABLE OF IMPROVING LITHOGRAPHY CHARACTERISTIC BY INCLUDING NITROGEN-CONTAINING ORGANIC COMPOUND COMPONENTS

机译:抗蚀剂成分,形成抗蚀剂图案的方法以及能够通过包含含氮有机化合物成分来改善光刻技术特性的稀有化合物

摘要

PURPOSE: A resist composition, a method for forming resist patterns, and noble compounds are provided to improve the rectangularity and the resolution of the resist patterns.;CONSTITUTION: A resist composition includes a base material, a nitrogen-containing organic compound, and an acid generating agent. The acid generating agent generates acid by exposure. The dissolution of the base material to a developing solution is changed by the action of acid. The nitrogen-containing organic compound contains a compound represented by chemical formula 1. The acid generating agent excludes the compound represented by chemical formula 1. In chemical formula 1, RN is nitrogen-containing heterocyclic group with/without a substituted group; X0 is a C1 to C10 linear or branched divalent aliphatic hydrocarbon group, a C3 to C20 cyclic or partially cyclic divalent aliphatic hydrocarbon group, or a group in which a part or whole of hydrogen atoms of the preceding hydrocarbon groups is substituted with fluorine atoms; and M^+ is organic cation.;COPYRIGHT KIPO 2012
机译:目的:提供抗蚀剂组合物,形成抗蚀剂图案的方法和贵族化合物以改善抗蚀剂图案的矩形性和分辨率。组成:抗蚀剂组合物包括基材,含氮有机化合物和产酸剂。产酸剂通过暴露产生酸。基础材料在显影液中的溶解通过酸的作用而改变。含氮有机化合物包含由化学式1表示的化合物。产酸剂不包括由化学式1表示的化合物。在化学式1中,RN是具有/不具有取代基的含氮杂环基; X0为碳原子数为1〜10的直链或支链的脂肪族烃基,碳原子数为3〜20的环状或部分环状的二价脂肪族烃基,或上述烃基的氢原子的一部分或全部被氟原子取代的基团。 M ^ +是有机阳离子。; COPYRIGHT KIPO 2012

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