首页>
外国专利>
PROCESS-SIGNIFICANT DATA DETERMINATION METHOD FOR A VACUUM DEPOSITION PROCESS TO IMPROVE THE RELIABILITY OF A FOLLOWING MEASUREMENT OR ADJUSTMENT PROCESS
PROCESS-SIGNIFICANT DATA DETERMINATION METHOD FOR A VACUUM DEPOSITION PROCESS TO IMPROVE THE RELIABILITY OF A FOLLOWING MEASUREMENT OR ADJUSTMENT PROCESS
展开▼
机译:用于提高后续测量或调整过程的可靠性的真空沉积过程的过程重要数据确定方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
PURPOSE: A process-significant data determination method for a vacuum deposition process is provided to minimize an error in determination of process-significant data caused by measuring position and/or spectroscopy.;CONSTITUTION: A process-significant data determination method for a vacuum deposition process comprises the steps of: determining three or more intensities of spectrum lines of two or more process materials from light emitting spectrum, determining a first relative intensity from a pair of the intensities based on a first mathematical relation, determining a second relative intensity from another pair of the intensities, and calculating an intensity relation(IV) as process-significant data from the first and second relative intensities.;COPYRIGHT KIPO 2012
展开▼