MEMORY REPAIR ANALYZING APPARATUS WITH A ROW SPARE REGION AND A COLUMN SPARE REGION, A MEMORY REPAIR ANALYZING METHOD, AND A TEST APPARATUS

摘要

PURPOSE: A memory repair analyzing apparatus, a memory repair analyzing method, and a test apparatus are provided to reduce memory test time and repair analysis time.;CONSTITUTION: A row directional fault memory unit(132) memorizes the number of fault cells in a row. A column directional fault memory unit(134) memorizes the number of fault cells in a column. A row directional weight memory unit(136) memorizes the sum of the fault cells in the column with the fault cell included in the corresponding row. A column directional weight memory unit(138) memorizes the sum of the fault cells in the row with the fault cell included in the corresponding column. A determining unit(150) determines whether the fault cell is substituted by a row spare region or a column spare region based on the values of the row directional fault memory unit, the column directional fault memory unit, the row directional weight memory unit, and the column directional weight memory unit.;COPYRIGHT KIPO 2013;[Reference numerals] (10) Tested memory; (110) Test unit; (112) Test signal generating unit; (114) Signal input and output unit; (116) Expected value comparing unit; (120) Fail memory unit; (122) Buffer unit; (132) Row directional fault memory unit; (134) Column directional fault memory unit; (136) Row directional weight memory unit; (138) Column directional weight memory unit; (140) Relieving unit; (150) Determining unit