首页> 外国专利> Apparatus for Indentation Test Involving Micom and Evaluating Method of Residual Stress using The Same

Apparatus for Indentation Test Involving Micom and Evaluating Method of Residual Stress using The Same

机译:Micom压痕试验装置及使用该装置的残余应力评估方法

摘要

The present invention relates to an instrumented indentation tester with a built-in microcomputer and a residual stress measuring method using the same.;An embodiment of the present invention is a driver installed inside the main body of the tester, a slider connected to the axis of the driver, a slider guide for guiding the slider, the indenter in conjunction with the slider, a load sensor for measuring the indentation load, Instrumented indentation tester with a built-in microcomputer comprising a displacement sensor for measuring the indentation depth, a microcomputer connected to the interface with the driver, and a main computer connected to the microcomputer by wire or wireless to calculate the residual stress of the test specimen. to provide.;The present invention provides an instrumented indentation tester and a method of measuring residual stress using the same, which are advantageous for mechanical property evaluation and can be used for nondestructive measurement. It can be applied to a wide range of structures and has the effect of not being affected by the microstructure.;Tester, Micom, Hardness Tester, Instrumentation Indentation Tester
机译:技术领域本发明涉及一种具有内置微型计算机的仪器化压痕测试仪以及使用该仪器的残余应力测量方法。本发明的实施例是一种驱动器,其安装在测试仪主体内部,滑块连接至轴。驱动器,用于引导滑块的滑块导轨,与滑块结合的压头,用于测量压痕载荷的负载传感器,带有内置微型计算机的仪器化压痕测试仪,该微型计算机具有用于测量压痕深度的位移传感器,微型计算机连接到与驱动程序的接口,以及通过有线或无线方式连接到微型计算机的主计算机,以计算试样的残余应力。本发明提供了一种仪器化的压痕测试仪和使用该仪器的压痕测试仪测量残余应力的方法,其对于机械性能评估是有利的并且可以用于无损测量。它可以应用于各种结构,并具有不受微观结构影响的效果。;测试仪,Micom,硬度测试仪,仪器压痕测试仪

著录项

  • 公开/公告号KR101117661B1

    专利类型

  • 公开/公告日2012-03-07

    原文格式PDF

  • 申请/专利权人 (주)프론틱스;

    申请/专利号KR20090113902

  • 发明设计人 김광호;장희광;

    申请日2009-11-24

  • 分类号G01N3/42;G01N3/40;G01L1;

  • 国家 KR

  • 入库时间 2022-08-21 17:08:33

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