首页> 外国专利> ELECTROMAGNETIC WAVE/PARTICLE BEAM SPECTROSCOPY AND ELECTROMAGNETIC WAVE/PARTICLE BEAM SPECTROSCOPE

ELECTROMAGNETIC WAVE/PARTICLE BEAM SPECTROSCOPY AND ELECTROMAGNETIC WAVE/PARTICLE BEAM SPECTROSCOPE

机译:电磁波/粒子束谱和电磁波/粒子束谱

摘要

The present invention other than the electronic noise, vibration, for sound, heat and specific particle beam to be noted, electromagnetic particle beam, electrical noise caused by electromagnetic waves, mechanical destruction, and a solid formed and the resistance to half the atom, for the radiation detecting means of the spectral feature having a high resistance compared with the conventional electromagnetic wave energy decomposition technique is difficult degradation -particle beam spectroscopic method and an electromagnetic wave-relates to a particle beam spectroscope, the spectroscopic device 10 and a Laplace transform filter 11 to convert the intensity of the incident spectrum Laplace, detection elements for detecting the transmitted intensity of the incident spectrum ( 15), and converts the transmitted intensity of the incident spectrum inverse Laplace detected, the arithmetic unit 17 for calculating the intensity of incident light incident on the incident spectrum is characterized in that it comprises the Laplace transform filter (11).
机译:本发明除电子噪声,振动外,还需注意声音,热量和特定粒子束,电磁粒子束,由电磁波引起的电噪声,机械破坏,形成的固体以及对半原子的抵抗力,与常规电磁波能量分解技术相比,具有高电阻的光谱特征的放射线检测装置难以降解-粒子束光谱法,并且电磁波涉及粒子束光谱仪,光谱装置10和拉普拉斯变换滤光片在图11中,将入射光谱的强度转换成拉普拉斯,检测入射光谱的透射强度的检测元件(15),并对入射光谱的透射强度进行逆转换,将拉普拉斯检测出,算术单元17计算入射光的强度入射光谱上的入射是特征因为它包括拉普拉斯变换滤波器(11)。

著录项

  • 公开/公告号KR101118222B1

    专利类型

  • 公开/公告日2012-03-20

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20097023788

  • 发明设计人 무토 사다츠구;

    申请日2009-03-12

  • 分类号G01T1/36;G01J3/28;

  • 国家 KR

  • 入库时间 2022-08-21 17:08:34

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