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DETECTION OF MACRO-DEFECTS USING MICRO-INSPECTION INPUTS

机译:使用微检查输入检测宏缺陷

摘要

Inspection apparatus according to the invention includes an optical inspection means (28) for providing one or more optical inspection output representing the pattern of the cells is repeated on the substrate. Thereby analyzing means 32 is a group selected characteristic portions of the isolated cells to be repeated by receiving the one or more output optical inspection. Analysis reporting means with respect to the selected isolated of recurring cells group characteristics part, and providing an output indication of the change in at least one of said isolated group selected characteristic portions, In this case, the change is a plurality of cells of the repetitive cells It occurs along.
机译:根据本发明的检查设备包括光学检查装置(28),用于提供一个或多个光学检查输出,该输出表示在基板上重复的单元的图案。从而,分析装置32是通过接收一个或多个输出光学检查而重复的隔离细胞的一组选定特征部分。分析报告装置针对所选择的隔离的重复单元组特征部分,并提供至少一个所述隔离的组选择特征部分中的变化的输出指示,在这种情况下,该变化是重复的多个单元细胞它沿着发生。

著录项

  • 公开/公告号KR101146081B1

    专利类型

  • 公开/公告日2012-05-15

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20057017277

  • 申请日2004-03-17

  • 分类号H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 17:08:05

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