Fault Detection and Test Response Compaction with Array of Two-Input Linear Logic

著录项

• 来源
  《电气工程：英文版》 |2014年第1期|P.1-11|共11页
• 作者

  Sunil R. Das; Satyendra N. Biswas; Alexander R. Applegate; Voicu Groza; Mansour H. Assaf;

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• 作者单位

  [1]School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, ONKIN6N5, Canada;

  [2]Department of Computer Science, College of Arts and Sciences, Troy University, Montgomery, AL 36103, USA;

  Department of Computer Science, College of Arts and Sciences, Troy University, Montgomery, AL 36103, USA;

  [3]School of Engineering and Technology, Kaziranga University, Jorhat 785006, India;

  [4]Faculty of Science and Technology, USP （University of the South Pacific）, Suva 19128, Fiji;

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• 收录信息
• 原文格式 PDF
• 正文语种 CHI
• 中图分类 电气测量技术及仪器;
• 关键词

  电气控制; 控制理论; 电气测量; 集中参数;

  机译：电气控制;控制理论;电气测量;集中参数;