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Micro-structure measurement device using diffraction of laser

机译:利用激光衍射的微结构测量装置

摘要

The present invention relates to a measuring apparatus using the fine structure in the loop of the laser. The invention allows to observe a sample and a loop of light in various occurring when the laser beam is irradiated to the sample in the sample stand which the scanning of the laser and a monochromatic laser beam irradiated from the laser beam syringe with the laser beam a syringe at the same time characterized in that loops will composed of a detection member that. Using the device of the present invention can determine the distance between silteum or structure micron size such as a CD by using a loop to the laser and quantitatively, and in the case of fiber or fabric to the spacing of compactness of the gap can be seen to homogeneity. ;
机译:本发明涉及一种在激光器回路中使用精细结构的测量装置。当激光束照射到样品台中的样品上时,本发明允许观察样品和光的各种循环,其中激光和从激光束注射器照射的单色激光束的扫描被激光束a扫描。同时注射器的特征在于,回路将由一个检测元件组成。使用本发明的装置,可以通过使用到激光器的环路并定量地确定诸如CD的硅质或结构微米尺寸之间的距离,并且在纤维或织物的情况下,可以看到间隙的紧密度同质化。 ;

著录项

  • 公开/公告号KR101180247B1

    专利类型

  • 公开/公告日2012-09-05

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20100020225

  • 发明设计人 한상욱;박창인;박영우;

    申请日2010-03-08

  • 分类号G01N21/47;G01N23/20;G01B11/00;

  • 国家 KR

  • 入库时间 2022-08-21 17:07:29

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