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METHOD FOR CREATING REFERENCE GAGES FOR NON-DESTRUCTIVE SPECTRAL METHODS OF MEASURING IMPURITY CONCENTRATION IN CRYSTALS

机译:一种用于测量晶体中杂质浓度的非破坏性光谱方法的参考量规的创建方法

摘要

FIELD: chemistry.; SUBSTANCE: according to the method, the roentgenofluorescence intensity of the analytic line is measured in the tested sample (crystal) and the roentgenofluorescence intensity of the same line is measured in working mixture containing a known amount of the measured element. A calibration chart is built and the absolute concentration of the impurities in the sample. At the same time spectral measurements of the sample are carried out, their results are compared with the results of roentgenofluorescence measurement and a reference gage is acquired for future use in impurity spectral analysis in industrial-scale production of the crystals.; EFFECT: creation of reference gages (reference crystal samples) while retaining measurement accuracy for controlled crystal properties.;4 dwg
机译: FIELD:化学。 物质:根据该方法,在被测样品(晶体)中测量分析线的伦琴荧光强度,并在含有已知量的被测混合物中测量同一条线的伦琴荧光强度。元件。会建立一个校准图,以及样品中杂质的绝对浓度。同时进行样品的光谱测量,将其结果与放射荧光测量的结果进行比较,并获得参考量规,以备将来用于工业规模生产晶体的杂质光谱分析中。 效果:创建参考量具(参考晶体样品),同时保持测量精度以控制晶体性能。; 4 dwg

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