首页> 外国专利> Cleaning module for cleaning multi-layer mirror of extreme UV projection exposure system of semiconductor lithography plant, has heating element for heating hydrogen at temperature below dissociation temperature of hydrogen

Cleaning module for cleaning multi-layer mirror of extreme UV projection exposure system of semiconductor lithography plant, has heating element for heating hydrogen at temperature below dissociation temperature of hydrogen

机译:用于清洁半导体光刻厂的极端紫外线投射曝光系统的多层镜的清洁模块,具有用于在低于氢的解离温度的温度下加热氢的加热元件

摘要

The module has a supplying device for supplying molecular hydrogen (2), and a tungsten coil (3) for producing atomic hydrogen. A heating element (4) heats the atomic and molecular hydrogen at a temperature below dissociation temperature of the atomic and molecular hydrogen. The heating element comprises a larger surface than that of the coil and is switched independent of the coil, where the heating element and the coil are connected with same ground line. A control unit controls voltage at the heating element and the coil, where the heating element is made of tungsten.
机译:该模块具有用于供给分子氢的供给装置(2)和用于产生原子氢的钨线圈(3)。加热元件(4)在低于原子和分子氢的解离温度的温度下加热原子和分子氢。加热元件包括比线圈大的表面,并且独立于线圈而切换,其中加热元件和线圈通过相同的接地线连接。控制单元控制加热元件和线圈处的电压,其中加热元件由钨制成。

著录项

  • 公开/公告号DE102010044970A1

    专利类型

  • 公开/公告日2011-12-22

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT GMBH;

    申请/专利号DE20101044970

  • 发明设计人 KALLER JULIAN;

    申请日2010-09-10

  • 分类号G03F7/20;

  • 国家 DE

  • 入库时间 2022-08-21 17:05:22

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