首页>
外国专利>
Method for manufacturing semiconductor element for e.g. CPU, involves providing buried insulating layer under active region of substrate, removing part of oxidized material and forming drain- and source regions in active region
Method for manufacturing semiconductor element for e.g. CPU, involves providing buried insulating layer under active region of substrate, removing part of oxidized material and forming drain- and source regions in active region
The method involves forming a semiconductor material i.e. germanium, on a silicon-containing semiconductor base material (203B) e.g. silicon material or silicon/germanium material, of an active region (203A) of a substrate (201). A buried insulating layer (202) is provided under the active region. A part of the semiconductor material is oxidized such that the semiconductor material is driven into the base material up to the insulating layer. A part of the oxidized semiconductor material is removed, and drain- and source regions and recesses (204) are formed in the active region. Independent claims are also included for the following: (1) a method for manufacturing a transistor (2) a semiconductor element comprising a silicon-containing channel region.
展开▼