首页> 外国专利> Mirror i.e. free-form mirror, for extreme UV-projection exposure system for extreme UV microlithography to produce structures in e.g. nanometer range for electronic components, has mirror surface, where mirror has specific surface roughness

Mirror i.e. free-form mirror, for extreme UV-projection exposure system for extreme UV microlithography to produce structures in e.g. nanometer range for electronic components, has mirror surface, where mirror has specific surface roughness

机译:反射镜,即自由形式的反射镜,用于极端UV投影曝光系统,用于极端UV微光刻以产生例如电子元件的纳米范围,具有镜面,其中镜具有特定的表面粗糙度

摘要

The mirror (1) has a mirror surface with mirror sectors (2) that are integrally formed from a mirror component (5) with another mirror surface (8). The mirror has a surface roughness of less than or equal to 1 nanometer at cutoff-wavelength of less than or equal to 10 micrometers. The mirror sectors include average or maximum size in a range from 0.3 to 4 mm in diameter or in relation to a maximum edge length. The mirror component is formed from a mirror base material (3) such as silicon, silicon dioxide, glass, quartz glass or metal. An independent claim is also included for a method for manufacturing a mirror for a projection exposure system for microlithography.
机译:镜(1)具有镜表面,镜表面具有镜扇形部分(2),镜扇形部分(2)由镜组件(5)与另一个镜表面(8)一体形成。该镜子在截止波长小于或等于10微米时具有小于或等于1纳米的表面粗糙度。镜面扇区的平均或最大尺寸在直径范围内或相对于最大边缘长度为0.3至4mm。反射镜部件由诸如硅,二氧化硅,玻璃,石英玻璃或金属的反射镜基材(3)形成。还包括用于制造用于微光刻的投影曝光系统的反射镜的方法的独立权利要求。

著录项

  • 公开/公告号DE102011083464A1

    专利类型

  • 公开/公告日2012-08-30

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT GMBH;

    申请/专利号DE20111083464

  • 发明设计人 DAVYDENKO VLADIMIR;

    申请日2011-09-27

  • 分类号G02B5/10;G02B5/09;G02B1;G03F7/20;G21K1/06;

  • 国家 DE

  • 入库时间 2022-08-21 17:04:51

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