首页> 外国专利> Support for mirror of extreme UV-projection exposure system used in microlithography process to produce small structure in e.g. nanometer range, has actuators associated to bipod holder, mirror connection and support elements as compensator

Support for mirror of extreme UV-projection exposure system used in microlithography process to produce small structure in e.g. nanometer range, has actuators associated to bipod holder, mirror connection and support elements as compensator

机译:支持微光刻工艺中使用的极端UV投影曝光系统的镜面,以产生小结构,例如纳米范围,具有与两脚架,反射镜连接和支撑元件相关的执行器作为补偿器

摘要

The support has a bipod holder (2), a mirror connection (6), and support elements (2', 6') for fixedly connecting a mirror (7) with a holder or a housing part (1). Actuators (5, 5') e.g. piezo elements, are associated to the bipod holder, the mirror connection and the support elements as a compensator. The actuators are designed so that an actuating possibility of the actuators is adjusted relative to a type and/or a magnitude of one or multi dimensional position change of position deviations to be expected due to temperature fluctuations, aging phenomena and/or assembly inaccuracies. Independent claims are also included for the following: (1) a projection exposure system (2) a method for operating a projection exposure system.
机译:该支架具有一个两脚架固定器(2),一个反光镜连接件(6)和用于将反光镜(7)与一个固定器或壳体部件(1)固定连接的支承元件(2',6')。执行器(5,5')例如压电元件与两脚架,镜面连接和支撑元件相关联,作为补偿器。致动器被设计成使得致动器的致动可能性相对于由于温度波动,老化现象和/或组装不准确而预期的位置偏差的一维或多维位置变化的类型和/或大小被调节。还包括以下方面的独立权利要求:(1)投影曝光系统(2)一种用于操作投影曝光系统的方法。

著录项

  • 公开/公告号DE102011080408A1

    专利类型

  • 公开/公告日2013-02-07

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT GMBH;

    申请/专利号DE20111080408

  • 发明设计人 SCHAFFER DIRK;

    申请日2011-08-04

  • 分类号G02B7/198;G02B7/00;G03F7/20;

  • 国家 DE

  • 入库时间 2022-08-21 16:22:24

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