首页> 外国专利> LOW COHERENCE INTERFEROMETRIC SYSTEM FOR PHASE STEPPING SHEAROGRAPHY COMBINED WITH 3D SURFACE SHAPE MEASUREMENT

LOW COHERENCE INTERFEROMETRIC SYSTEM FOR PHASE STEPPING SHEAROGRAPHY COMBINED WITH 3D SURFACE SHAPE MEASUREMENT

机译:低相干干涉测量系统,用于相变步进成像和3D表面形状测量

摘要

PROBLEM TO BE SOLVED: To provide a portable industrial instrument for performing, in an integrated and two-way manner, an interferometric fringe projection and shearography, on an object to be tested.;SOLUTION: When a two-way interferometer (1) is associated with a coherent or quasi-coherent projection device (2), the portable industrial instrument is able to measure the 3D shape of the object by interferometric fringe projection, also known as moire method, and, when the two-way interferometer (1) is associated with a recording or imaging device (4), the instrument is able to perform shearographic measurements on the object, the direction of the traversing light beam in the interferometer (1) being reversed when shifting from one measurement configuration to the other one.;COPYRIGHT: (C)2013,JPO&INPIT
机译:要解决的问题:提供一种便携式工业仪器,以集成方式和双向方式对要测试的对象进行干涉条纹投影和剪切成像;解决方案:当使用双向干涉仪(1)时与相干或准相干投影设备(2)关联时,便携式工业仪器能够通过干涉条纹投影(也称为莫尔条纹法)以及当使用双向干涉仪(1)来测量对象的3D形状当将其与记录或成像设备(4)关联时,该仪器能够对物体执行切线照相测量,当从一种测量配置转换到另一种测量配置时,干涉仪(1)中的行进光束的方向会反转。 ;版权:(C)2013,JPO&INPIT

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