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CIRCUIT PERFORMANCE MEASUREMENT DEVICE AND CIRCUIT PERFORMANCE MEASUREMENT METHOD

机译:电路性能测量装置和电路性能测量方法

摘要

PROBLEM TO BE SOLVED: To provide a circuit performance measurement device capable of effectively performing performance measurement and a performance measurement method.;SOLUTION: A circuit performance measurement device has a performance measurement circuit description generation unit 11 for retrieving a communication path of each of a request signal which is a performance measurement object signal and a data signal in a measurement object circuit description 3 and generating a verification circuit description 7 with a performance measurement path which transmits a latency result measured by a performance measurement register 420 arranged in the communication path of the request signal to a performance measurement register 421 of the data signal, and a performance measurement execution unit 12 for executing performance verification by using the verification circuit description 7 with the performance measurement path and measuring latency of the performance measurement object signal to output performance measurement result data 8.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种能够有效地执行性能测量的电路性能测量装置和性能测量方法。解决方案:电路性能测量装置具有性能测量电路描述生成单元11,该性能测量电路描述生成单元11用于检索每个的通信路径。请求信号,该请求信号是性能对象信号描述和测量对象电路描述3中的数据信号,并生成具有性能测量路径的验证电路描述7,该性能测量路径发送由布置在通信路径中的性能测量寄存器420测量的等待时间结果将请求信号发送到数据信号的性能测量寄存器421,以及性能测量执行单元12,该性能测量执行单元12通过将验证电路描述7与性能测量路径一起使用性能电路来测量性能,并测量性能测量对象信号的延迟。输出性能测量结果数据8 .;版权:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013120489A

    专利类型

  • 公开/公告日2013-06-17

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20110268165

  • 发明设计人 NISHIDE TAKEO;

    申请日2011-12-07

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 17:03:02

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