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METHOD FOR MEASURING SLICE THICKNESS, PHANTOM, AND X-RAY CT SCANNER

机译:切片厚度,幻影和X射线CT扫描仪的测量方法

摘要

PROBLEM TO BE SOLVED: To stably measure slice thickness of a tomogram obtained by X-ray CT scanning.;SOLUTION: A phantom has a member including a part 52a formed so that slice-thickness direction (z-direction) thickness in a slice space 60 subject to the X-ray CT scanning can be linearly changed with respect to one direction (e.g. x-direction) perpendicular to the slice-thickness direction. The slice thickness t of the tomogram 61 is determined on the basis of a first profile P1 obtained by performing the first derivation of a profile P0 of a one-direction pixel value of the tomogram 61 obtained by performing the X-ray CT scanning of the phantom. Differently from a conventional phantom made of a wire and a plate, the phantom like this enables the slice thickness to be stably measured because a slope surface can be easily worked and maintained with high linear precision without the risk of rupture.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:为了稳定地测量通过X射线CT扫描获得的断层图像的切片厚度;解决方案:体模具有一个部件,该部件包括一个形成为在切片空间中的切片厚度方向(z方向)厚度的部分52a。可以在垂直于切片厚度方向的一个方向(例如,x方向)上线性地改变经受X射线CT扫描的60°。断层图像61的切片厚度t基于通过对断层图像的X射线CT扫描获得的断层图像61的单向像素值的轮廓P0进行一次推导而获得的第一轮廓P1来确定。幻影。与传统的由线和板制成的体模不同,像这样的体模可以稳定地测量切片厚度,因为可以容易地以高线性精度加工和保持倾斜表面而没有破裂的风险。 )2013年,日本特许厅&INPIT

著录项

  • 公开/公告号JP2012245234A

    专利类型

  • 公开/公告日2012-12-13

    原文格式PDF

  • 申请/专利权人 GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY CO LLC;

    申请/专利号JP20110120525

  • 发明设计人 NISHIDE AKIHIKO;

    申请日2011-05-30

  • 分类号A61B6/03;

  • 国家 JP

  • 入库时间 2022-08-21 17:02:01

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