SAMPLE ANALYSIS METHOD, SAMPLE SLICE COLLECTION DEVICE, AND CUTTING-EDGE FOR SAMPLE SLICE COLLECTION

摘要

PROBLEM TO BE SOLVED: To reduce the occurrence of a phenomenon that characteristics of a sample rarely appear in reflected light when the reflected light is observed by throwing a measuring beam on a sample slice in the state that the sample slice is mounted on a rake surface of a cutting-edge.SOLUTION: The rake surface (1a) of the cutting-edge (1) for sample slice collection is provided with a groove (1b), a projecting line, ruggedness, a step, or a salient angle, or the cutting-edge is provided with a notch. Air is enclosed between the sample slice (Ps) and the rake surface (1a), so that the sample slice (Ps) is prevented from sticking to almost all over the rake surface (a1) of the cutting-edge (1). Thus, The occurrence of a phenomenon that the characteristics of the sample slice rarely appear in the reflected light is reduced.