首页> 外国专利> BY-PRODUCT REMOVAL APPARATUS, CLEANED LEACHED CUTTER, METHOD FOR REMOVING BY-PRODUCT MATERIAL, AND METHOD FOR DETERMINING EFFECTIVENESS OF REMOVING BY-PRODUCT MATERIAL

BY-PRODUCT REMOVAL APPARATUS, CLEANED LEACHED CUTTER, METHOD FOR REMOVING BY-PRODUCT MATERIAL, AND METHOD FOR DETERMINING EFFECTIVENESS OF REMOVING BY-PRODUCT MATERIAL

机译:副产品去除装置,清洁的沥滤槽,去除副产品材料的方法以及确定去除副产品材料的效果的方法

摘要

PROBLEM TO BE SOLVED: To provide a cleaned leached component having a polycrystalline structure, a method and apparatus for cleaning a leached component to form the cleaned leached component, and a method for determining the effectiveness of cleaning the leached component.;SOLUTION: A cleaned leached component includes at least one leached layer that has at least a portion of by-product materials removed from the inside. An apparatus and method for cleaning includes a tank, a cleaning fluid placed within the tank, and at least a portion of the leached layer immersed into the cleaning fluid. A method for determining the effectiveness of cleaning includes cleaning the leached component to form the cleaned leached component, measuring one or more capacitance values of the cleaned leached component, and repeating the cleaning and the measuring until achieving a stable lower limit capacitance value.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供具有多晶结构的清洁的浸出组分,用于清洁浸出的组分以形成清洁的浸出组分的方法和装置,以及确定清洁浸出的组分的有效性的方法。浸出的组分包括至少一层浸出的层,该层具有从内部除去的至少一部分副产物材料。一种用于清洁的设备和方法,包括:槽;放置在槽内的清洁液;以及浸出层的至少一部分浸入清洁液中。一种确定清洁效果的方法,该方法包括清洁浸出的成分以形成清洁的浸出的成分,测量清洁后的浸出的成分的一个或多个电容值,并重复清洁和测量,直到达到稳定的下限电容值。 :(C)2013,JPO&INPIT

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