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PHOTOGRAMMETRY SYSTEM AND PHOTOGRAPHING CONDITION DETERMINATION METHOD FOR PHOTOGRAMMETRY

机译:摄影测量系统及摄影条件的确定方法

摘要

PROBLEM TO BE SOLVED: To provide a photogrammetry system in which photogrammetric simulation is performed and a photogrammetric point and a photographing condition for accurately performing photogrammetry can be evaluated beforehand, and a photographing condition determination method for photogrammetry.;SOLUTION: A photogrammetry system and a photographing condition determination method for photogrammetry are obtained in which a temporary measurement point 7 is set to a measurement target model 61 which is created on a 3D CAD space 31 and a shape around that point is analyzed, thereby selecting a logical measurement point extraction processing method for extracting a logical measurement point for accurately performing photogrammetry around the temporary measurement point 7. The logical measurement point obtained by performing temporary photogrammetry according to this method is compared with design data to determine whether desired measurement precision can be obtained. Thus, a photographing position/direction suitable for actual photogrammetry can be acquired.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种摄影测量系统,在该摄影测量系统中进行摄影测量模拟,并且可以预先评估用于精确执行摄影测量的摄影测量点和摄影条件,以及摄影测量的摄影条件确定方法。获得用于摄影测量的摄影条件确定方法,其中将临时测量点7设置到在3D CAD空间31上创建的测量目标模型61,并且分析该点周围的形状,从而选择逻辑测量点提取处理方法。用于提取用于在临时测量点7周围精确地执行摄影测量的逻辑测量点。将通过根据该方法执行临时摄影测量而获得的逻辑测量点与设计数据进行比较,以确定是否可以获得期望的测量精度。因此,可以获得适合实际摄影测量的摄影位置/方向。版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013064618A

    专利类型

  • 公开/公告日2013-04-11

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP20110202491

  • 发明设计人 SHIRAISHI TADAMICHI;ASHIDA YUKI;

    申请日2011-09-16

  • 分类号G01C11/06;G06T1/00;

  • 国家 JP

  • 入库时间 2022-08-21 17:01:07

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