首页> 外国专利> METHOD FOR ESTIMATING MAGNETIC FLUX DENSITY OF MAGNETIC CONDUCTIVE PARTICLE AND METHOD FOR DETERMINING QUALITY OF MAGNETIZATION STATE OF MAGNETIC CONDUCTIVE PARTICLE

METHOD FOR ESTIMATING MAGNETIC FLUX DENSITY OF MAGNETIC CONDUCTIVE PARTICLE AND METHOD FOR DETERMINING QUALITY OF MAGNETIZATION STATE OF MAGNETIC CONDUCTIVE PARTICLE

机译:磁导粒子的磁通密度的估计方法和磁导粒子的磁化状态的质量的确定方法

摘要

PROBLEM TO BE SOLVED: To provide a method for simply and accurately estimating a magnetic flux density of magnetic conductive particles at least a part of which is composed of magnetic materials, and a method for simply and accurately determining quality of the magnetization state of the magnetic conductive particles to be used for an anisotropic conductive film.SOLUTION: The method for estimating magnetic flux density of the magnetic conductive particles includes: dispersing a plurality of magnetic conductive particles each having different magnetic flux densities in organic solvents respectively; measuring initial light transmittance T(%) of the plurality of obtained dispersion liquid immediately after dispersion; measuring light transmittance T(%) of supernatant liquid of the dispersion liquid left to stand still for n hours after the dispersion; calculating light transmittance difference &Dgr;T(%) by subtracting Tfrom T; and acquiring a primary regression equation from the plurality of light transmittance differences &Dgr;T(%) thus calculated and logarithms of the plurality of magnetic flux densities corresponding to the light transmittance differences. A magnetic flux density obtained by applying, to the regression equation, the obtained light transmittance difference &Dgr;T(%) of the magnetic conductive particle of which the magnetic flux density is unknown, is estimated to be the magnetic flux density of the magnetic conductive particle.
机译:解决的问题:提供一种用于简单且准确地估计至少一部分由磁性材料构成的导电颗粒的磁通密度的方法,以及一种用于简单且准确地确定磁体的磁化状态的质量的方法。解决方案:估计导电颗粒的磁通密度的方法包括:将分别具有不同磁通密度的多个导电颗粒分散在有机溶剂中;和分散后立即测定所得的多种分散液的初始透光率T(%)。测定分散后n小时静置的分散液的上清液的透光率T(%)。通过从T中减去T来计算透光率差&Dgr(T)。根据如此计算出的多个透光率差ΔT(%)以及与该透光率差对应的多个磁通密度的对数,求出一次回归方程。通过将回归磁通密度未知的导磁颗粒的透光率差&Dgr(T)%应用于回归方程而获得的磁通密度被估计为导磁体的磁通密度。粒子。

著录项

  • 公开/公告号JP2013148537A

    专利类型

  • 公开/公告日2013-08-01

    原文格式PDF

  • 申请/专利权人 DEXERIALS CORP;

    申请/专利号JP20120011012

  • 发明设计人 SAKAMOTO ATSUSHI;YAMAMOTO JUN;

    申请日2012-01-23

  • 分类号G01N27/74;

  • 国家 JP

  • 入库时间 2022-08-21 17:01:02

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