首页> 外国专利> METHOD FOR MEASURING AVERAGE PARTICLE DIAMETER, NORMALIZED DISPERSION VALUE, VOLUME FRACTION OF PRIMARY PARTICLE AND HIGH-ORDER PARTICLE OF ORGANIC PIGMENT

METHOD FOR MEASURING AVERAGE PARTICLE DIAMETER, NORMALIZED DISPERSION VALUE, VOLUME FRACTION OF PRIMARY PARTICLE AND HIGH-ORDER PARTICLE OF ORGANIC PIGMENT

机译:颜料平均粒径,归一化色散值,主要颗粒体积分数和有机颜料高阶颗粒的测量方法

摘要

PROBLEM TO BE SOLVED: To provide a method for measuring an average particle diameter and a normalized dispersion value of not only primary particles, but high-order particles such as secondary particles or tertiary particles of organic pigment and to provide a method for measuring a volume fraction of the primary particles and the high-order particles.;SOLUTION: An average particle diameter and a normalized dispersion value of not only primary particles, but high-order particles such as secondary particles or tertiary particles of organic pigment are measured by utilizing super small angle X-ray scattering measurement. In addition, volume fraction of the primary particles and the high-order particles are measured. Furthermore, even when the organic pigment is at states of powder, fluid dispersion, a printed matter, and a coated film, particle diameter physical property values such as the average diameter, the normalized dispersion value, and the volume fraction of the primary particles and the high-order particles of the organic pigment are measured.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种不仅测量一次粒子的平均粒径和归一化色散值的方法,而且还测量有机颜料的二次粒子或三次粒子之类的高阶粒子的方法,并提供一种测量体积的方法。解决方案:通过使用超微粒子,不仅可以测量初级颗粒的平均粒径和归一化色散值,还可以测量初级颗粒和有机颜料的次级颗粒或三次颗粒等高级颗粒的平均粒径和归一化分散值。小角度X射线散射测量。另外,测量一次粒子和高阶粒子的体积分数。此外,即使当有机颜料处于粉末,流体分散体,印刷物和涂膜的状态时,粒径物理性质值例如平均粒径,归一化分散值和一次颗粒的体积分数也是如此。测量有机颜料的高级颗粒。;版权所有:(C)2013,日本特许厅&INPIT

著录项

  • 公开/公告号JP2013096944A

    专利类型

  • 公开/公告日2013-05-20

    原文格式PDF

  • 申请/专利权人 DIC CORP;

    申请/专利号JP20110242248

  • 发明设计人 MAKI HIROSHI;KOIKE JUNICHIRO;BABA SHINGO;

    申请日2011-11-04

  • 分类号G01N15/02;

  • 国家 JP

  • 入库时间 2022-08-21 17:00:35

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