Method for measuring the electromagnetic performance of the grain-oriented silicon steel sheet

摘要

Method of measuring the electromagnetic performance of oriented silicon steel sheet according to the present invention measures the Euler angles of the crystal grains in the sample by metallographic etch-pit method, calculated the crystal grains of the crystal orientation difference θi a (degrees), combined with the crystal grains of the surface area Si (mm ²⁾ and the Si element of the correction coefficient X (X = 0.1~10T / degree), using these parameters (θi, Si, X), the magnetic properties of single crystal material B ₀ (saturation induction, T) on the basis of, corrected by the following equation (1). [1] By the above estimation, to get the electromagnetic performance B ₈ of the grain-oriented silicon steel sheet. The invention, in a state in which in the absence of a magnetic measuring device or the weight and size of the sample and too small, or the surface quality defects not available magnetic measuring device because of, solved the challenge of performing a magnetic measurement of the sample.