SURFACE NORMAL MEASUREMENT DEVICE, SURFACE NORMAL MEASUREMENT SYSTEM, AND SURFACE NORMAL MEASUREMENT PROGRAM

摘要

PROBLEM TO BE SOLVED: To measure a surface normal without including a specular reflection component in reflection characteristics of an object surface and without measuring a distance to the object surface.;SOLUTION: A surface normal measurement system 1 comprises: an illuminating device 30 moving in planes orthogonally crossing each other along rails Rx, Ry and changing an illumination direction to an object OBJ; a photographing device 40 for photographing the object OBJ; and a surface normal measurement device 10 for measuring a surface normal of the surface of the object OBJ on the basis of an image photographed by the photographing device 40. The surface normal measurement device 10 binarizes the image of the object OBJ, creates a shadow vector in which the illumination direction and like-dark are associated with each other for each pixel, and estimates a surface normal associated with a reference shadow vector, which is the most similar to the shadow vector of the object OBJ to be a surface normal in the image, by referring to a database in which the reference shadow vector created about a reference object of which shape is known beforehand and the surface normal are associated with each other.;COPYRIGHT: (C)2013,JPO&INPIT