首页> 外国专利> DEFECTIVE FACTOR DETECTION DEVICE AND DEFECTIVE FACTOR DETECTION METHOD

DEFECTIVE FACTOR DETECTION DEVICE AND DEFECTIVE FACTOR DETECTION METHOD

机译:缺陷因素检测装置和缺陷因素检测方法

摘要

PROBLEM TO BE SOLVED: To provide a defective factor detection method capable of easily specifying, at a high speed, a factor of an appearance defect generated in a manufacturing process.SOLUTION: A defective factor detection device 114 specifies a defective area which is an area with the appearance defect from a plurality of areas obtained by dividing the appearance of a product into the areas, on the basis of inspection result information including data related to a defect found from the appearance of the product in an inspection after manufacturing of the product, extracts a video part related to the defective area as a defective factor video image from work video data for which work during manufacturing of the product is video-recorded, and displays the defective factor video image.
机译:解决的问题:提供一种缺陷因数检测方法,该方法能够容易地高速地确定在制造过程中产生的外观缺陷的因数。解决方案:缺陷因数检测装置114将缺陷区域指定为区域根据检查结果信息,包括通过将产品的外观划分为多个区域而获得的来自多个区域的外观缺陷,检查结果信息包括与从产品制造后的检查中从产品的外观中发现的缺陷有关的数据,从记录有产品制造过程中的工作的工作视频数据中提取与缺陷区域有关的视频部分作为缺陷因子视频图像,并显示缺陷因子视频图像。

著录项

  • 公开/公告号JP2013003688A

    专利类型

  • 公开/公告日2013-01-07

    原文格式PDF

  • 申请/专利权人 PANASONIC CORP;

    申请/专利号JP20110131724

  • 发明设计人 HISATAKE YOICHI;SHIMODA RIICHI;

    申请日2011-06-14

  • 分类号G05B19/418;G06Q50/04;

  • 国家 JP

  • 入库时间 2022-08-21 16:58:48

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号