首页> 外国专利> THREE-DIMENSIONAL POSITIONING MICROSCOPE DEVICE FOR DOT-LIKE OBJECT AND MICROSCOPE METHOD

THREE-DIMENSIONAL POSITIONING MICROSCOPE DEVICE FOR DOT-LIKE OBJECT AND MICROSCOPE METHOD

机译:点状物体的三维定位微镜装置及微镜方法

摘要

PROBLEM TO BE SOLVED: To provide a three-dimensional positioning microscope device for a dot-like object and a microscope method.SOLUTION: The microscope device comprises: two imaging optical systems 26 and 26' for imaging a dot-like object in two separate image spaces in the form of focus light distributions 40 and 40'; two detection units 28 and 28' that capture analyzable light spots at the detection points of detection faces 27 and 27' arranged in the corresponding image spaces; and an evaluation unit configured such that the detection points of the two detection faces 27 and 27' are made to correspond to each other in a pair and the two light spots are analyzed, thereby ascertaining the lateral x-y position and axial z position of the dot-like object. The two imaging optical systems include optical means for obliquely directing their respective focus light distributions with respect to the detection axis perpendicular to the detection faces of the corresponding detection units. The inclinations of the two focus light distributions are opposite to each other and, thereby, the two light spots shift in opposite directions according to a change in the z position of the dot-like object.
机译:解决的问题:提供一种用于点状物体的三维定位显微镜装置和一种显微镜方法。解决方案:该显微镜装置包括:两个成像光学系统26和26',用于在两个单独的位置成像点状物体。聚焦光分布40和40'形式的图像空间;两个检测单元28和28',其捕获布置在相应图像空间中的检测面27和27'的检测点处的可分析光斑;评估单元被配置为使得两个检测面27和27'的检测点成对地彼此对应并且分析两个光斑,从而确定点的横向xy位置和轴向z位置类对象。这两个成像光学系统包括用于相对于与垂直于相应检测单元的检测面的检测轴倾斜地引导它们各自的聚焦光分布的光学装置。两个聚焦光分布的倾斜彼此相反,因此,两个光斑根据点状对象的z位置的变化而沿相反方向移动。

著录项

  • 公开/公告号JP2013057938A

    专利类型

  • 公开/公告日2013-03-28

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS CMS GMBH;

    申请/专利号JP20120191312

  • 发明设计人 MARCUS DYBA;

    申请日2012-08-31

  • 分类号G02B21;G01B11;

  • 国家 JP

  • 入库时间 2022-08-21 16:58:22

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