首页> 外国专利> PROCESSING METHOD OF BASE MATERIAL, SEMICONDUCTOR DEVICE, AND COMPOSITION FOR TEMPORARY FIXTURE

PROCESSING METHOD OF BASE MATERIAL, SEMICONDUCTOR DEVICE, AND COMPOSITION FOR TEMPORARY FIXTURE

机译:基本材料,半导体装置及临时治具的组成的处理方法

摘要

PROBLEM TO BE SOLVED: To provide a processing method of a base material which prevents the permeability of infrared rays from deteriorating due to temperature rise of a support medium and efficiently peels the base material from the support medium in a peeling process of the base material using the infrared rays.;SOLUTION: A processing method of a base material includes the steps of: (1) temporarily fixing a support medium, formed by a base material and a silicon wafer, through a temporary fixing material having a photothermal conversion layer; (2) processing the base material; (3) radiating infrared rays to the temporary fixing material from the support medium side without focusing on a surface opposite to a contact surface of the support medium, contacting with the temporary fixing material; and (4) peeling the base material from the support medium.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种基材的处理方法,其防止红外线的渗透性由于支撑介质的温度升高而劣化,并且在使用该基材的剥离过程中有效地从支撑介质剥离基材。解决方案:基材的处理方法包括以下步骤:(1)通过具有光热转换层的临时固定材料临时固定由基材和硅晶片形成的支撑介质。 (2)加工基材; (3)在不聚焦于与支撑介质的接触面相反的面的状态下,从支撑介质侧向临时固定材料放射红外线,并与临时固定材料接触。 (4)从支撑介质上剥离基材。版权所有:(C)2013,日本特许厅&INPIT

著录项

  • 公开/公告号JP2013110352A

    专利类型

  • 公开/公告日2013-06-06

    原文格式PDF

  • 申请/专利权人 JSR CORP;

    申请/专利号JP20110256118

  • 申请日2011-11-24

  • 分类号H01L21/304;H01L21/02;

  • 国家 JP

  • 入库时间 2022-08-21 16:58:00

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