CURED STATE MEASURING INSTRUMENT AND CURED STATE MEASURING METHOD

摘要

PROBLEM TO BE SOLVED: To provide an instrument capable of suitably measuring the cured state of an adhesive.;SOLUTION: A cured state measuring instrument 10 comprises: a second optic fiber 26 that emits light from its tip surface; a probe 18 that, while holding an adhesive 36, exposes the light to the adhesive 36 in the state that the adhesive 36 is in contact with the tip surface of the second optic fiber 26; a detector 20 that detects the light returning to the second optic fiber 26 after reflecting from an interface between the tip surface of the second optic fiber 26 and the adhesive 36; and a computer 22 that calculates a refraction index of the adhesive 36 based on a percentage of the amount of the light detected by the detector 20 to the amount of the light emitted from the tip surface of the second optic fiber 26.;COPYRIGHT: (C)2013,JPO&INPIT