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CURED STATE MEASURING INSTRUMENT AND CURED STATE MEASURING METHOD

机译:CURT状态测量仪器及CURT状态测量方法

摘要

PROBLEM TO BE SOLVED: To provide an instrument capable of suitably measuring the cured state of an adhesive.;SOLUTION: A probe 18 of a cured state measuring instrument comprises: a second optic fiber 26 that emits measurement light from its tip surface 26a; a light guide member 34 that is detachably connected to the tip surface 26a of the second optic fiber 26 and directs the measurement light to an adhesive 36 in the state that its light emission surface is brought in contact with the adhesive 36; and a detector that detects the reflected light returning to the light guide member 34 from an interface between the light emission surface of the light guide member 34 and the adhesive 36.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种能够适当地测量粘合剂的固化状态的仪器。解决方案:固化状态的测量仪器的探针18包括:第二光纤26,其从其尖端表面26a发射测量光;以及第二光纤26。导光部件34可拆卸地连接到第二光纤26的末端表面26a,并且在其光发射表面与粘合剂36接触的状态下将测量光引导至粘合剂36。探测器;检测器,其检测从导光构件34的发光表面与粘合剂36之间的界面返回到导光构件34的反射光。;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013007681A

    专利类型

  • 公开/公告日2013-01-10

    原文格式PDF

  • 申请/专利权人 NIPPON SHEET GLASS CO LTD;

    申请/专利号JP20110141127

  • 发明设计人 FUKUZAWA TAKASHI;TANAKA HIROYUKI;

    申请日2011-06-24

  • 分类号G01N21/35;G01N33/44;

  • 国家 JP

  • 入库时间 2022-08-21 16:57:57

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