Test method response measuring device of an electronic device, response measurement method, manufacturing method, and design improvement methods

摘要

I suggest the use of a hybrid system utilizing both the active load pull and challenge a passive load pull. [MEANS FOR SOLVING PROBLEMS] Analyzed at a relatively high power level behavior of the high-frequency device is referred to as the test device (ie, DUT) and generally in the art, or the invention relates to a measuring method and a measurement system for evaluating the characteristics . For example, apparatus according to, using such devices or to design the system amplifier or the like used in a base station associated with telecommunications or other cellular network, for use in (large signal) frequency amplifier high power it may be necessary to analyze when designing the circuit. Measuring device for measuring the response of the electronic device for high frequency input signals comprises a connectable active load pull circuit to the electronic device to be measured. Passive load-pull device is included in the active load-pull circuit. [Selection] Figure Figure 1