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Electric micrometer detector method of manufacturing the same, and electric micrometer detector

机译:电动千分尺检测器的制造方法以及电动千分尺检测器

摘要

PPROBLEM TO BE SOLVED: To provide an electric micrometer-use detector which is high-quality and inexpensive. PSOLUTION: The electric micrometer-use detector 10 which includes coil part assemblies 14a (14b), wherein positions of coils 34a (34b) are determined and fixed to axial positions and their perpendicular positions with respect to magnetic lids 30a (30b) such that the coils 34a (34b) are arranged on prescribed axial positions and their perpendicular positions with respect to the magnetic lids 30a (30b), is characterized in that the axial position and its perpendicular position of a magnetic case 12 are determined and fixed with respect to the magnetic lids 30a, 30b of the respective coil part assemblies 14a, 14b, such that in the magnetic case 12, the two coil part assemblies 14a, 14b are arranged symmetrically about the center position PSB0/SBof the magnetic case. PCOPYRIGHT: (C)2009,JPO&INPIT
机译:

要解决的问题:提供一种高质量且廉价的电动千分尺检测器。

解决方案:千分尺用电动千分尺检测器10包括线圈部分组件14a(14b),其中线圈34a(34b)的位置确定并固定在轴向位置及其相对于磁性盖30a(30b)的垂直位置从而使得线圈34a(34b)布置在预定的轴向位置上并且相对于磁性盖30a(30b)位于垂直位置,其特征在于,磁性盒12的轴向位置及其垂直位置被确定并固定为相对于各个线圈部分组件14a,14b的磁性盖30a,30b,使得在磁性壳体12中,两个线圈部分组件14a,14b关于中心位置P 0 对称地布置磁性表壳。

版权:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP5269357B2

    专利类型

  • 公开/公告日2013-08-21

    原文格式PDF

  • 申请/专利权人 株式会社ミツトヨ;

    申请/专利号JP20070183073

  • 发明设计人 尾関 敏治;

    申请日2007-07-12

  • 分类号G01B3/18;

  • 国家 JP

  • 入库时间 2022-08-21 16:57:17

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