X-RAY DIFFRACTION MEASURING INSTRUMENT AND RESIDUAL STRESS MEASURING METHOD

摘要

PROBLEM TO BE SOLVED: To detect residual stress of a measuring object even if the shape of a diffraction ring due to an X-ray of the measuring object is detected in a discontinuous state.;SOLUTION: Diffraction ring shape data groups representing the shapes of a plurality of comparison diffraction rings changing in accordance with a change in residual stress are respectively stored in a controller CT in association with the residual stress. The controller CT detects shapes of diffraction rings by an X-ray of the measuring object, and respectively calculates matching degrees of the detected shapes of the diffraction rings of the measuring object to the shapes of a plurality of comparison diffraction rings represented by the stored diffraction ring shape data groups. Then, the controller CT calculates residual stress corresponding to a comparison diffraction ring being the most similar to the detected shape of the diffraction ring of the measuring object as residual stress of the measuring object on the basis of a relation between the stored residual stress and the calculated matching degrees.;COPYRIGHT: (C)2013,JPO&INPIT