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METHOD FOR DETECTING CRACK OF SUBSTRATE, AND METHOD FOR OPERATING ION BEAM IRRADIATION DEVICE BASED ON METHOD FOR DETECTING CRACK OF SUBSTRATE
METHOD FOR DETECTING CRACK OF SUBSTRATE, AND METHOD FOR OPERATING ION BEAM IRRADIATION DEVICE BASED ON METHOD FOR DETECTING CRACK OF SUBSTRATE
PROBLEM TO BE SOLVED: To inexpensively detect crack of a substrate over a wide range with a simple structure in an ion beam irradiation device.;SOLUTION: An ion beam irradiation device 1 comprises: a substrate support member 9 which has one or more openings on a face opposing to a rear face of a substrate 8; a substrate drive mechanism which drives the substrate support member 9 having the substrate 8 mounted thereon, and transfers the substrate 8 to an irradiated region in which the substrate 8 is irradiated with at least some of ion beams 3 and to a non-irradiated region in which the substrate 8 is not irradiated with the ion beams 3; and a beam current measuring instrument 11 arranged at a position to be irradiated with the ion beams 3 on the downstream side of the substrate 8. The ion beam irradiation device 1 detects the presence or absence of the crack of the substrate based on a measured value of the beam current measured by the beam current measuring instrument 11 when the substrate 8 is transferred into the irradiated region.;COPYRIGHT: (C)2013,JPO&INPIT
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