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Method of calibration spectral width measuring instrument, spectral width instrument calibration equipment, narrow-band laser apparatus, exposure apparatus, and method of manufacturing an electronic device

机译:校准光谱宽度测量仪器的方法,光谱宽度仪器校准设备,窄带激光设备,曝光设备以及电子设备的制造方法

摘要

PROBLEM TO BE SOLVED: To provide a calibration method of spectral width measuring equipment capable of always or periodically determining whether calibration of the spectral width measuring equipment is required.;SOLUTION: The calibration method of the spectral width measuring equipment for monitoring a spectral width of light irradiated from a laser light source includes: a first step (S13) of shifting the center wavelength of a spectrum of the light by a predetermined amount based on a measurement value measured by a center wavelength measuring unit for measuring the center wavelength of the spectrum of the light; a second step (S15) of measuring a shift amount of the spectrum of the light based on the shift of the center wavelength of the spectrum of the light in the first step by the spectral width measuring unit; and a third step (S16) of determining whether calibration of the spectral width measuring equipment is required based on the predetermined amount of shift of the center wavelength of the spectrum of the light in the first step and the shift amount of the spectrum of the light measured in the second step.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种光谱宽度测量设备的校准方法,该校准方法能够始终或定期确定是否需要对光谱宽度测量设备进行校准。从激光源照射的光包括:第一步(S13),其基于由用于测量光谱中心波长的中心波长测量单元测量的测量值,将光光谱中心波长偏移预定量。光的第二步骤(S15),由光谱宽度测量单元基于第一步中的光谱的中心波长的偏移来测量光谱的偏移量;第三步骤(S16),其基于第一步骤中光的光谱的中心波长的预定偏移量和光的光谱的偏移量,确定是否需要对光谱宽度测量设备进行校准。版权:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP5141359B2

    专利类型

  • 公开/公告日2013-02-13

    原文格式PDF

  • 申请/专利权人 株式会社ニコン;

    申请/专利号JP20080115242

  • 发明设计人 土岐 剛史;石田 幸司;

    申请日2008-04-25

  • 分类号H01S3/00;H01L21/027;G03F7/20;

  • 国家 JP

  • 入库时间 2022-08-21 16:56:15

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