首页> 外国专利> The defective observation device, and defective observation method

The defective observation device, and defective observation method

机译:不良观察装置及不良观察方法

摘要

A defect review apparatus for reviewing a specimen by moving the specimen to pre-calculated coordinate includes: a function to measure a deviation amount between the pre-calculated coordinates and coordinates of an actual position of the specimen; a function to optimize a coordinate correcting expression to minimize the measured deviation amount; and a function to determine that the deviation amounts have converged. When the deviation amounts have converged, the measurement for the coordinate-correcting-expression optimization is terminated, minimizing a reduction in throughput. field of view (FOV) necessary for the specimen to be within the FOV is set according to a convergence value of the calculated deviation amount.
机译:一种用于通过将样本移动到预先计算的坐标来检查样本的缺陷检查设备,包括:测量预先计算的坐标与样本的实际位置的坐标之间的偏差量的功能;优化坐标校正表达式以最小化测得的偏差量的功能;确定偏差量收敛的功能。当偏差量收敛时,终止用于坐标校正表达式优化的测量,从而最小化吞吐量的降低。根据计算出的偏差量的收敛值来设定样本在FOV内所需的视场(FOV)。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号