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Directing to the dielectricity factor calculation device in target ones, and target ones

机译:分别针对目标和目标中的介电系数计算装置

摘要

PROBLEM TO BE SOLVED: To provide a device and method capable of calculating a dielectric constant in an object from reflection characteristics of the object speedily as numeric values by transmitting electromagnetic waves toward the object of a dielectric for receiving reflection waves.;SOLUTION: The dielectric constant calculation device includes a plurality of transmission antennas and a plurality of reception antennas for receiving reflection waves of electromagnetic waves obtained by transmitting the electromagnetic waves to an object. Based on the received reflection waves, a complex reflectance when electromagnetic waves of plane waves impinge on the surface of the object is calculated. The complex dielectric constant of the object is calculated from the calculated complex reflectance, based on conditions that a propagation formula of electromagnetic waves assuming that one portion of transmitted electromagnetic waves enters the object should satisfy. The plurality of transmission antennas and the plurality of reception antennas form a line in one direction to compose a linear array antenna.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种装置和方法,该装置和方法能够通过将电磁波向电介质的对象传输以接收反射波,从而迅速地根据该对象的反射特性以数值形式计算该对象的介电常数。常数计算装置包括多个发射天线和多个接收天线,用于接收通过将电磁波发射到物体而获得的电磁波的反射波。基于接收到的反射波,计算当平面波的电磁波撞击在物体表面上时的复反射率。基于所计算的复数反射率,基于假设电磁波的传播公式假定所发射的电磁波的一部分进入物体的条件,该物体的复数介电常数应被满足。多个发射天线和多个接收天线在一个方向上形成一条线,以构成线性阵列天线。;版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP5197461B2

    专利类型

  • 公开/公告日2013-05-15

    原文格式PDF

  • 申请/专利权人 三井造船株式会社;

    申请/专利号JP20090078021

  • 发明设计人 木村 憲明;

    申请日2009-03-27

  • 分类号G01N22/00;G01R27/26;G01R27/06;

  • 国家 JP

  • 入库时间 2022-08-21 16:55:11

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