APPARATUS FOR TESTING IMMUNITY OF ELECTRONIC EQUIPMENT AGAINST FLUCTUATING ELECTRIC FIELD AND METHOD FOR TESTING IMMUNITY OF ELECTRONIC EQUIPMENT AGAINST FLUCTUATING ELECTRIC FIELD

摘要

In a testing apparatus, an electronic equipment to be an equipment under test; EUT is exposed to an electric field by unit of an emission electrode, and an intensity of the electric field applied to the electronic equipment during a test is fluctuated by electric field fluctuating unit. Operating characteristics of the electronic equipment are tested by generating induction charging inside the electronic equipment by the fluctuation electric field during the test. As a result, it becomes possible to test malfunction caused by a discharge phenomenon generated inside the electronic equipment, which cannot be tested with a conventional ESD testing apparatus.