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DYNAMICALLY DETERMINING NUMBER OF SIMULATIONS REQUIRED FOR CHARACTERIZING INTRA-CIRCUIT INCONGRUENT VARIATIONS
DYNAMICALLY DETERMINING NUMBER OF SIMULATIONS REQUIRED FOR CHARACTERIZING INTRA-CIRCUIT INCONGRUENT VARIATIONS
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机译:动态确定表征回路内不连续变化所需的模拟数量
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摘要
A method is disclosed comprising using a circuit recognition engine running on a computerized device to detect a number and type devices in an integrated circuit. The method characterizes device variation by selecting a set of dominant active devices and performing simulation using the set of dominant active devices. Three different options may be used to optimize the number of simulations for any arc/slew/load combination. Aggressive reduction uses a minimal number of simulations at the cost of some accuracy loss, conservative reduction reduces the number of simulations with negligible accuracy loss, and dynamic reduction dynamically determines the minimum number of simulations needed for a given accuracy requirement.
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