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System and Method for Measuring Phase-Matching Spectral Phase Curve by Nonlinear Optical Spectral Interferometry

机译:非线性光谱干涉测量相位匹配光谱相位曲线的系统和方法

摘要

A system for measuring a phase-matching spectral phase curve by nonlinear spectral interferometry includes a broadband light source, a first beam splitter, a first nonlinear crystal, a second nonlinear crystal and a spectrometer. The first beam splitter splits the broadband light source into a first light and a second light. The first nonlinear crystal is used for converting the first light into a third light, wherein the third light has a reference phase spectrum. The second nonlinear crystal is used for converting the second light into a fourth light which encoded a phase-matching spectral phase of the second nonlinear to crystal. The spectrometer is used for providing an interferogram from an interference between the third light and the fourth light. Thus, by analyzing the interferogram, the phase-matching spectral phase curve of the second nonlinear crystal can be measured without knowing the spectral phase of the broadband light source.
机译:一种通过非线性光谱干涉法测量相位匹配光谱相位曲线的系统,包括宽带光源,第一分束器,第一非线性晶体,第二非线性晶体和光谱仪。第一分束器将宽带光源分成第一光和第二光。第一非线性晶体用于将第一光转换为第三光,其中第三光具有参考相位光谱。第二非线性晶体用于将第二光转换为第四光,该第四光将第二非线性与晶体的相位匹配光谱相位编码。光谱仪用于提供来自第三光和第四光之间的干涉的干涉图。因此,通过分析干涉图,可以在不知道宽带光源的光谱相位的情况下测量第二非线性晶体的相位匹配光谱相位曲线。

著录项

  • 公开/公告号US2013265581A1

    专利类型

  • 公开/公告日2013-10-10

    原文格式PDF

  • 申请/专利权人 NATIONAL TSING HUA UNIVERSITY;

    申请/专利号US201213649129

  • 发明设计人 SHANG-DA YANG;

    申请日2012-10-11

  • 分类号G01J3/45;

  • 国家 US

  • 入库时间 2022-08-21 16:48:23

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