首页> 外国专利> Method and structure for forming high performance MOS capacitor along with fully depleted semiconductor on insulator devices on the same chip

Method and structure for forming high performance MOS capacitor along with fully depleted semiconductor on insulator devices on the same chip

机译:在同一芯片上的绝缘体器件上形成高性能MOS电容器以及完全耗尽的半导体的方法和结构

摘要

An integrated circuit is provided that includes a fully depleted semiconductor device and a capacitor present on a semiconductor on insulator (SOI) substrate. The fully depleted semiconductor device may be a finFET semiconductor device or a planar semiconductor device. In one embodiment, the integrated circuit includes a substrate having a first device region and a second device region. The first device region of the substrate includes a first semiconductor layer that is present on a buried insulating layer. The buried insulating layer that is in the first device region is present on a second semiconductor layer of the substrate. The second device region includes the second semiconductor layer, but the first semiconductor layer and the buried insulating layer are not present in the second device region. The first device region includes the fully depleted semiconductor device. A capacitor is present in the second device region.
机译:提供了一种集成电路,其包括完全耗尽的半导体器件和存在于绝缘体上半导体(SOI)衬底上的电容器。完全耗尽的半导体器件可以是finFET半导体器件或平面半导体器件。在一个实施例中,集成电路包括具有第一器件区域和第二器件区域的衬底。衬底的第一器件区域包括存在于掩埋绝缘层上的第一半导体层。在第一器件区域中的掩埋绝缘层存在于衬底的第二半导体层上。第二器件区域包括第二半导体层,但是在第二器件区域中不存在第一半导体层和掩埋绝缘层。第一器件区域包括完全耗尽的半导体器件。在第二器件区域中存在电容器。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号