首页> 外国专利> Method of computing global-to-local metrics for recognition

Method of computing global-to-local metrics for recognition

机译:用于识别的全局到局部度量的计算方法

摘要

A method of computing global-to-local metrics for recognition. Based on training examples with feature representations, the method automatically computes a local metric that varies over the space of feature representations to optimize discrimination and the performance of recognition systems.;Given a set of points in an arbitrary features space, local metrics are learned in a hierarchical manner that give low distances between points of same class and high distances between points of different classes. Rather than considering a global metric, a class-based metric or a point-based metric, the proposed invention applies successive clustering to the data and associates a metric to each one of the clusters.
机译:一种计算全局到局部度量以进行识别的方法。基于带有特征表示的训练示例,该方法自动计算在特征表示空间上变化的局部度量,以优化识别和识别系统的性能。;鉴于任意特征空间中的一组点,在一种分等级的方式,可以使相同类别的点之间的距离较小,而不同类别的点之间的距离较高。提出的发明不是考虑全局度量,基于类的度量或基于点的度量,而是将连续的聚类应用于数据并将度量与每个聚类相关联。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号