首页> 外国专利> Method for inspecting defect of article to be inspected

Method for inspecting defect of article to be inspected

机译:检验被检物品缺陷的方法

摘要

A method of inspecting defects in an inspection target includes (1) a step of supplying a particle-containing gas to one end face of the inspection target under pressure, applying in parallel a first laser beam to the vicinity of the other end face of the inspection target, and photographing such end face from a position vertical to such end face, (2) a step of supplying a particle-containing gas to the one end face of the inspection target under pressure, applying in parallel a second laser beam to the vicinity of the other end face of the inspection target, and photographing such end face from a position vertical to such end face, and (3) a step of specifying defects in the inspection target from photographic results obtained by the steps (1) and (2).
机译:检查检查目标中的缺陷的方法包括(1)在压力下向检查目标的一个端面提供含颗粒气体的步骤,将第一激光束平行地施加到检查目标的另一端面附近。 (2)在加压下向检查对象的一个​​端面供给含微粒气体的步骤,将第二激光束平行地照射到被检查体的一个端面上。在检查对象的另一端面附近,并从与该端面垂直的位置拍摄该端面,以及(3)根据由步骤(1)和(1)获得的摄影结果确定检查对象中的缺陷的步骤2)。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号