首页> 外国专利> Process for enhancing dye polymer recording yields by pre-scanning coated substrate for defects

Process for enhancing dye polymer recording yields by pre-scanning coated substrate for defects

机译:通过预扫描涂层基材缺陷来提高染料聚合物记录产量的方法

摘要

A method for enhancing recording yields by monitoring dye polymer formation on a glass substrate is provided. After the glass substrate is coated with a dye polymer layer and before pits are formed on the dye-polymer coated glass, the dye polymer coated glass substrate is scanned to detect defects. The dye-polymer coated glass is discarded on the one hand if the defects detected through the scanning are at or above an unacceptable threshold level, and on the other hand data is written on the dye-polymer coated glass if the defects detected through the scanning are below the unacceptable threshold level.
机译:提供了一种通过监测玻璃基板上的染料聚合物形成来提高记录产率的方法。在玻璃基板上涂覆有染料聚合物层之后,并且在染料聚合物涂覆的玻璃上形成凹坑之前,扫描染料聚合物涂覆的玻璃基板以检测缺陷。一方面,如果通过扫描检测到的缺陷达到或超过不可接受的阈值水平,则丢弃染料聚合物涂覆的玻璃,另一方面,如果通过扫描检测到的缺陷,则将数据写入染料聚合物涂覆的玻璃低于不可接受的阈值水平。

著录项

  • 公开/公告号US8472020B2

    专利类型

  • 公开/公告日2013-06-25

    原文格式PDF

  • 申请/专利权人 THOMAS I. SWEENEY;

    申请/专利号US20050057941

  • 发明设计人 THOMAS I. SWEENEY;

    申请日2005-02-15

  • 分类号G01N21/00;G11B7/24;

  • 国家 US

  • 入库时间 2022-08-21 16:45:48

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