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METHOD FOR INSPECTING COATING FILM DEFECT IN RESIN-COATED FILM

机译:树脂涂膜的涂膜缺陷检查方法

摘要

The method for inspecting a resin-coated film of the present invention is a method for inspecting defects of a coating of a resin-coated film comprising a film and the coating formed by applying a resin solution on the film, in which the method is carried out by irradiating the coating with inspection light having a peak wavelength of emission intensity within the range of 385 to 415 nm and detecting reflected light of the inspection light, which can inspect defects of the coating of a resin-coated film with high accuracy.
机译:本发明的树脂被覆膜的检查方法是检查由膜构成的树脂被覆膜的被覆膜和在该膜上涂布树脂溶液而形成的被膜的缺陷的方法。通过用发射强度的峰值波长在385nm至415nm范围内的检查光照射涂层,并检测该检查光的反射光,可以高精度地检查树脂涂膜的涂层的缺陷。

著录项

  • 公开/公告号EP2226624A4

    专利类型

  • 公开/公告日2013-05-01

    原文格式PDF

  • 申请/专利权人 SUMITOMO CHEMICAL COMPANY LIMITED;

    申请/专利号EP20080855537

  • 发明设计人 SUZUKI TAKASHI;

    申请日2008-11-26

  • 分类号B05D3;C08J7/04;G01N21/33;G01N21/84;G01N21/88;G01N21/892;G01N21/894;H01M2/16;H01M10/05;H01M10/0565;

  • 国家 EP

  • 入库时间 2022-08-21 16:34:02

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